The ispLSI 5000VE Family of In-System Programmable High Density Logic Devices is based on Generic Logic Blocks (GLBs) of 32 registered macrocells and a single Global Routing Pool (GRP) structure interconnecting the GLBs.
Outputs from the GLBs drive the Global Routing Pool (GRP) between the GLBs. Switching resources are provided to allow signals in the Global Routing Pool to drive any or all the GLBs in the device. This mechanism allows fast, efficient connections across the entire device.
Each GLB contains 32 macrocells and a fully populated, programmable AND-array with 160 logic product terms and three extra control product terms. The GLB has 68 inputs from the Global Routing Pool which are available in both true and complement form for every product term. The 160 product terms are grouped in 32 sets of five and sent into a Product Term Sharing Array (PTSA) which allows sharing up to a maximum of 35 product terms for a single function. Alternatively, the PTSA can be bypassed for functions of five product terms or less. The three extra product terms are used for shared controls: reset, clock, clock enable and output enable.
• Second Generation SuperWIDE HIGH DENSITY IN-SYSTEM PROGRAMMABLE LOGIC DEVICE
— 3.3V Power Supply
— User Selectable 3.3V/2.5V I/O
— 18000 PLD Gates / 384 Macrocells
— Up to 192 I/O Pins
— 384 Registers
— High-Speed Global Interconnect
— SuperWIDE Generic Logic Block (32 Macrocells) for Optimum Performance
— SuperWIDE Input Gating (68 Inputs) for Fast Counters, State Machines, Address Decoders, etc.
— PCB Efficient Ball Grid Array (BGA) Package Options
— Interfaces with Standard 5V TTL Devices
• HIGH PERFORMANCE E2 CMOS TECHNOLOGY
— fmax = 165 MHz Maximum Operating Frequency
— tpd = 6.0 ns Propagation Delay
— TTL/3.3V/2.5V Compatible Input Thresholds and Output Levels
— Electrically Erasable and Reprogrammable
— Programmable Speed/Power Logic Path Optimization
• IN-SYSTEM PROGRAMMABLE
— Increased Manufacturing Yields, Reduced Time-toMarket, and Improved Product Quality
— Reprogram Soldered Devices for Faster Debugging
• 100% IEEE 1149.1 BOUNDARY SCAN TESTABLE AND 3.3V IN-SYSTEM PROGRAMMABLE
• ARCHITECTURE FEATURES
— Enhanced Pin-Locking Architecture with SingleLevel Global Routing Pool and SuperWIDE GLBs
— Wrap Around Product Term Sharing Array Supports up to 35 Product Terms Per Macrocell
— Macrocells Support Concurrent Combinatorial and Registered Functions
— Macrocell Registers Feature Multiple Control Options Including Set, Reset and Clock Enable
— Four Dedicated Clock Input Pins Plus Macrocell Product Term Clocks
— Programmable I/O Supports Programmable Bus Hold, Pull-up, Open Drain and Slew Rate Options
— Four Global Product Term Output Enables, Two Global OE Pins and One Product Term OE per Macrocell
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