EPC27TC32N

Features

High-performance CMOS EEPROM-based programmable logic devices (PLDs) built on third-generation Multiple Array MatriX (MAX) architecture

■ 5.0-V in-system programmability (ISP) through built-in IEEE Std. 1149.1 Joint Test Action Group (JTAG) interface

■ Built-in JTAG boundary-scan test (BST) circuitry compliant with IEEE Std. 1149.1-1990

■ High-density erasable programmable logic device (EPLD) family ranging from 6,000 to 12,000 usable gates (see Table 1)

■ 10-ns pin-to-pin logic delays with counter frequencies of up to 144 MHz

■ Fully compliant with the peripheral component interconnect Special Interest Group’s (PCI SIG) PCI Local Bus Specification, Revision 2.2

■ Dual-output macrocell for independent use of combinatorial and registered logic

■ FastTrack Interconnect for fast, predictable interconnect delays

■ Input/output registers with clear and clock enable on all I/O pins

■ Programmable output slew-rate control to reduce switching noise

■ MultiVolt I/O interface operation, allowing devices to interface with 3.3-V and 5.0-V devices

■ Configurable expander product-term distribution allowing up to 32 product terms per macrocell

■ Programmable power-saving mode for more than 50% power reduction in each macrocell

FAQ

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